ASTM E2444-11

Terminology Relating to Measurements Taken on Thin, Reflecting Films

ASTM International , 10/15/2011

Publisher: ASTM

File Format: PDF

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Description

Standard By:ASTM International , 10/15/2011

Published:10/15/2011

Pages:2

File Size:1 file , 63 KB

Language:English

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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.