• BS DD 174:1988

BS DD 174:1988

Guide to the calibration and setting up of the ultrasonic time of flight diffraction (TOFD) technique for the location and sizing of flaws

BSI Group , 01/01/1989

Publisher: BS

File Format: PDF

$95.00$190.50


The two transducer version of TOFD used to locate and size flaws as a result of linear scanning. Appendices provide a preliminary classification of defects and brief description of special techniques based on TOFD.

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