BS PD ISO/TR 14187:2020

This document provides an introduction to (and some examples of) the types of information that can beobtained about nanostructured materials using surface-analysis tools (Clause 5). Of equal importance,both general issues or challenges associated with characterizing nanostructured materials and thespecific opportunities or challenges associated with individual methods are identified (Clause 6). Asthe size of objects or components of materials approaches a few nanometres, the distinctions among"bulk", "surface" and "particle" analysis blur. Although some general issues relevant to characterizationof nanostructured materials are identified, this document focuses on issues specifically relevant tosurface chemical analysis of nanostructured materials. A variety of analytical and characterizationmethods will be mentioned, but this report focuses on methods that are in the domain of ISO/TC 201including Auger Electron Spectroscopy, X-ray photoelectron spectroscopy, secondary ion massspectrometry, and scanning probe microscopy. Some types of measurements of nanoparticle surfaceproperties such as surface potential that are often made in a solution are not discussed in this Report.