IEC 60749-1 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

International Electrotechnical Commission , 08/30/2002

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 08/30/2002

Published:08/30/2002

Pages:15

File Size:1 file , 390 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

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