IEC 60749-17 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission , 02/20/2003

Publisher: IEC

File Format: PDF

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Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

IEC 60749-17 Ed. 1.0 b:2003 History

IEC 60749-17 Ed. 2.0 b:2019
IEC 60749-17 Ed. 1.0 b:2003

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