IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission , 03/28/2019

Publisher: IEC

File Format: PDF

$25.00$51.00


IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

IEC 60749-17 Ed. 2.0 b:2019 History

IEC 60749-17 Ed. 2.0 b:2019
IEC 60749-17 Ed. 1.0 b:2003

More IEC Standards PDF

IEEE 836-2009

IEEE 836-2009

$86.00 $172.00

IEC 62153-4-13 Ed. 1.0 en:2009
IEC 60332-3-23 Ed. 1.1 b:2009
IEC 62153-4-12 Ed. 1.0 en:2009