IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission , 03/28/2019

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 03/28/2019

Published:03/28/2019

Pages:17

File Size:1 file , 1000 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

IEC 60749-17 Ed. 2.0 b:2019 History

IEC 60749-17 Ed. 2.0 b:2019

$25.00 $51.00

IEC 60749-17 Ed. 1.0 b:2003

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