IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission , 03/28/2019

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Standard By:International Electrotechnical Commission , 03/28/2019

Published:03/28/2019

Pages:17

File Size:1 file , 1000 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

IEC 60749-17 Ed. 2.0 b:2019 History

IEC 60749-17 Ed. 2.0 b:2019

$25.00 $51.00

IEC 60749-17 Ed. 1.0 b:2003

$11.00 $23.00

More IEC Standards PDF

IEEE 836-2009

$86.00 $172.00

IEC 62153-4-13 Ed. 1.0 en:2009

$47.00 $95.00

IEC 60332-3-23 Ed. 1.1 b:2009

$61.00 $123.00

IEC 62153-4-12 Ed. 1.0 en:2009

$47.00 $95.00