IEC 60749-23 Ed. 1.0 b:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

International Electrotechnical Commission , 02/23/2004

Publisher: IEC

File Format: PDF

$25.00$51.00


This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

More IEC Standards PDF

IEC 61156-5-2 Ed. 1.0 en:2002
IEC 62019 Amd.1 Ed. 1.0 b:2002
IEC 60684-3-211 Ed. 2.0 b:2002
IEEE 497-2002

IEEE 497-2002

$64.00 $129.00