• IEC 60749-24 Ed. 1.0 b:2005

IEC 60749-24 Ed. 1.0 b:2005

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

International Electrotechnical Commission , 11/21/2005

Publisher: IEC

File Format: PDF

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The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

IEC 60749-24 Ed. 1.0 b:2005 History

IEC 60749-24 Ed. 1.0 b:2005
IEC 60749-24 Ed. 1.0 b:2004

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