IEC 60749-29 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

International Electrotechnical Commission , 11/04/2003

Publisher: IEC

File Format: PDF

$55.00$110.00


Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to latch-up.

IEC 60749-29 Ed. 1.0 b:2003 History

IEC 60749-29 Ed. 2.0 b:2011
IEC 60749-29 Ed. 1.0 b:2003

More IEC Standards PDF

IEC 62443-2-1 Ed. 1.0 en:2010
IEC 60512-20-3 Ed. 1.0 b:2010
IEC 60770-2 Ed. 3.0 b:2010
IEC 62481-3 Ed. 1.0 en:2010

IEC 62481-3 Ed. 1.0 en:2010

$140.00 $281.00