IEC 60749-30 Amd.1 Ed. 1.0 b:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

International Electrotechnical Commission , 05/25/2011

Publisher: IEC

File Format: PDF

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Standard By:International Electrotechnical Commission , 05/25/2011

Published:05/25/2011

Pages:9

File Size:1 file , 200 KB

Language:English, French

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