IEC 60749-30 Ed. 2.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

International Electrotechnical Commission , 08/17/2020

Publisher: IEC

File Format: PDF

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IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.

IEC 60749-30 Ed. 2.0 b:2020 History

IEC 60749-30 Ed. 2.0 b:2020
IEC 60749-30 Ed. 1.1 b:2011
IEC 60749-30 Amd.1 Ed. 1.0 b:2011
IEC 60749-30 Ed. 1.0 b:2005

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