IEC 60749-31 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

International Electrotechnical Commission , 08/30/2002

Publisher: IEC

File Format: PDF

$12.00$25.00


Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

More IEC Standards PDF

IEEE 1012-2012

IEEE 1012-2012

$127.00 $254.00

IEC 61587-4 Ed. 1.0 b:2012
IEC 61056-1 Ed. 3.0 b:2012
ICC NC-FGC-2012

ICC NC-FGC-2012

$36.00 $73.00