IEC 60749-35 Ed. 1.0 b:2006

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

International Electrotechnical Commission , 07/18/2006

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Standard By:International Electrotechnical Commission , 07/18/2006

Published:07/18/2006

Pages:43

File Size:1 file , 1 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

More IEC Standards PDF

IEC 62059-31-1 Ed. 1.0 b:2008

$208.00 $417.00

IEC 61753-082-2 Ed. 1.0 b:2008

$47.00 $95.00

IEEE C57.93-2007

$55.00 $110.00

IEC 61606-3 Ed. 1.0 en:2008

$107.00 $214.00