IEC 60749-4 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

International Electrotechnical Commission , 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00


Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

IEC 60749-4 Ed. 1.0 b:2002 History

IEC 60749-4 Ed. 2.0 b:2017
IEC 60749-4 Ed. 2.0 en:2017
IEC 60749-4 Ed. 1.0 b CORR1:2003
IEC 60749-4 Ed. 1.0 b:2002

More IEC Standards PDF

IEC GUIDE 104 Ed. 4.0 en:2010
IEC 61076-2-107 Ed. 1.0 b:2010
IEC GUIDE 116 Ed. 1.0 en:2010
IEC 60705 Ed. 4.0 b:2010

IEC 60705 Ed. 4.0 b:2010

$139.00 $278.00