IEC 60749-4 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

International Electrotechnical Commission , 04/12/2002

Publisher: IEC

File Format: PDF

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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

IEC 60749-4 Ed. 1.0 b:2002 History

IEC 60749-4 Ed. 2.0 b:2017
IEC 60749-4 Ed. 2.0 en:2017
IEC 60749-4 Ed. 1.0 b CORR1:2003
IEC 60749-4 Ed. 1.0 b:2002

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