IEC 60749-4 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

International Electrotechnical Commission , 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00


Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

IEC 60749-4 Ed. 1.0 b:2002 History

IEC 60749-4 Ed. 2.0 b:2017
IEC 60749-4 Ed. 2.0 en:2017
IEC 60749-4 Ed. 1.0 b CORR1:2003
IEC 60749-4 Ed. 1.0 b:2002

More IEC Standards PDF

IEC 60670-21 Ed. 1.1 b:2016
IEEE 421.3-2016

IEEE 421.3-2016

$28.00 $56.00

IEC 62453-303-1 Ed. 1.1 b:2016
IEC 61069-2 Ed. 2.0 b:2016

IEC 61069-2 Ed. 2.0 b:2016

$139.00 $278.00