• Your shopping cart is empty!

PDF Preview

IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

International Electrotechnical Commission , 07/22/2020

Publisher: IEC

File Format: PDF

$95.00$190.00


Standard By:International Electrotechnical Commission , 07/22/2020
Published:07/22/2020
Pages:44
File Size:1 file , 1.5 MB
Language:English, French
Note:This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

More IEC Standards PDF

IEEE C37.011-2005

IEEE C37.011-2005

$55.00 $110.00

IEC 60745-2-5 Ed. 4.0 b:2006

IEC 60745-2-5 Ed. 4.0 b:2006

$89.00 $179.00

IEC 60384-19 Ed. 2.0 b:2006

IEC 60384-19 Ed. 2.0 b:2006

$91.00 $182.00

IEEE 1566-2005

IEEE 1566-2005

$45.00 $91.00