IEC 60749-5 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

International Electrotechnical Commission , 01/17/2003

Publisher: IEC

File Format: PDF

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Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

IEC 60749-5 Ed. 1.0 b:2003 History

IEC 60749-5 Ed. 3.0 b:2023
IEC 60749-5 Ed. 2.0 b:2017
IEC 60749-5 Ed. 2.0 en:2017
IEC 60749-5 Ed. 1.0 b:2003

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