IEC 60749-5 Ed. 2.0 en:2017

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

International Electrotechnical Commission , 04/10/2017

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 04/10/2017

Published:04/10/2017

Pages:9

File Size:1 file , 260 KB

Language:English

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.