IEC 60749-5 Ed. 3.0 b:2023

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

International Electrotechnical Commission , 12/01/2023

Publisher: IEC

File Format: PDF

$25.00$51.00


This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.

IEC 60749-5 Ed. 3.0 b:2023 History

IEC 60749-5 Ed. 3.0 b:2023
IEC 60749-5 Ed. 2.0 b:2017
IEC 60749-5 Ed. 2.0 en:2017
IEC 60749-5 Ed. 1.0 b:2003

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