IEC 60749-7 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

International Electrotechnical Commission , 04/09/2002

Publisher: IEC

File Format: PDF

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Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

IEC 60749-7 Ed. 1.0 b:2002 History

IEC 60749-7 Ed. 2.0 b:2011
IEC 60749-7 Ed. 1.0 b CORR1:2003
IEC 60749-7 Ed. 1.0 b:2002

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