IEC 60931-2 Ed. 2.0 b:1995

Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test and destruction test

International Electrotechnical Commission , 12/13/1995

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Standard By:International Electrotechnical Commission , 12/13/1995

Published:12/13/1995

Pages:17

File Size:1 file , 770 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Applies to capacitors according to IEC 60931-1 and gives the requirements for the ageing test and destruction test for these capacitors. The two ageing test methods are intended to ensure that the capacitor case temperature is maintained constant during the test. The destruction test is performed to evaluate the behaviour of the capacitor at the end of its life.

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