IEC 61189-5-503 Ed. 1.0 b:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

International Electrotechnical Commission , 05/22/2017

Publisher: IEC

File Format: PDF

$95.00$190.00


IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

IEC 61189-5-503 Ed. 1.0 b:2017 History

IEC 61189-5-503 Ed. 1.0 b:2017
IEC 61189-5-503 Ed. 1.0 en:2017

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