IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

International Electrotechnical Commission , 07/03/1996

Publisher: IEC

File Format: PDF

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Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

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