IEC 62373-1 Ed. 1.0 b:2020

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

International Electrotechnical Commission , 07/15/2020

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Standard By:International Electrotechnical Commission , 07/15/2020

Published:07/15/2020

Pages:44

File Size:1 file , 1.7 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).

This document also defines the terms pertaining to the conventional BTI test method.

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