IEC 62415 Ed. 1.0 b:2010

Semiconductor devices - Constant current electromigration test

International Electrotechnical Commission , 05/19/2010

Publisher: IEC

File Format: PDF

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Standard By:International Electrotechnical Commission , 05/19/2010

Published:05/19/2010

Pages:22

File Size:1 file , 910 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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