IEC 62527 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

International Electrotechnical Commission , 11/07/2007

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 11/07/2007

Published:11/07/2007

Pages:39

File Size:1 file , 1 MB

Language:English

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STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

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