IEC 62969-4 Ed. 1.0 b:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

International Electrotechnical Commission , 06/18/2018

Publisher: IEC

File Format: PDF

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IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

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