• IEEE 1149.8.1-2012

IEEE 1149.8.1-2012

IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components

IEEE , 08/09/2012

Publisher: IEEE

File Format: PDF

$53.00$106.00


IEEE 1149.8.1-2012 PDF

This standard specifies extensions to IEEE Std 1149.1(TM) that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.1 Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods. The purpose of this standard is to codify testability circuitry added to an IC incremental to the testability provisions specified by IEEE Std 1149.1. This will enable selective ac stimulus generation that, when combined with non-contact signal sensing, allows testing signal paths between devices adhering to this standard and passive and/or active components. New IEEE Standard - Inactive-Reserved. Extensions to IEEE Std 1149.1 that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components are specified. Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods.

More IEEE Standards PDF

IEC 61937-2 Ed. 1.0 en:2003
IEC 60191-2 Amd.9 Ed. 1.0 b:2003
IEC 61937-4 Ed. 1.0 b:2003
IEEE C95.4-2002

IEEE C95.4-2002

$30.00 $61.00